SOLUTIONS

Automotive/Vehicle Test
Data Storage
Embedded Controller Test
Jitter/Timing
Power Measurement
Serial Data Analysis
Beta Program
      
Extending Your Reach in Serial Data Testing

When it comes to serial data testing, LeCroy oscilloscopes and analyzers lead the way in providing optimum solutions for high-speed signal and data analysis. In offering a complete toolbox for the busy test and measurement engineer, LeCroy devices provide the ultimate end-to-end solution for the design cycle. From physical layer measurement to expert protocol testing for the message layer, LeCroy’s unique hardware and software architecture ensure superior performance, excellent value, and the fastest time-to-market.

SDA Series Real Time Oscilloscopes

Offering bandwidths from 18 GHz to 4 GHz, the SDA Series of oscilloscopes enables superior eye diagram fidelity for data rates up to 10 Gb/s.

These SDA instruments offer accurate and repeatable jitter analysis, precise eye patterns with violation locator, precision numerical clock recovery, and support for next generation standards PCI-E 2, FC 8.5, and FB-DIMM.


Protocol Analyzers and Exercisers

Used by semiconductor, device, system, and software developers, LeCroy protocol analysis solutions feature impressive capabilities including:

  • Monitoring bus activity, diagnosing operational and design problems, and confirming interoperability
  • Variety of configurations for a large range of applications
  • Functionality to assist design and test engineers and technicians through each phase of their products’ life-cycle
  • Powerful software that may be used directly with the equipment, or independently as a viewer and analysis tool
  • Flexible platforms that offer future functionality via field upgrades


WaveExpert® Series Sampling Oscilloscopes

This series offers the first instruments that combine the high bandwidth and accuracy of a sampling oscilloscope with the speed and flexibility of a real-time instrument. This series of Near Real Time Oscilloscopes (NRO), eliminates most of the constraints of traditional sampling oscilloscopes. Enabled by a new LeCroy technology—Advanced Throughput Architecture (ATA)—they offer up to 100 GHz bandwidth, signal acquisition speeds 100 times faster, and memory depths 125,000 times deeper than conventional sampling scopes.


Eye Doctor™
Measure the Receiver's Eye View

Virtual Probing™ and equalizer emulation enhance the capability of the SDA to allow the measurement of serial data signals in equalized systems.

  • Full signal integrity analysis of equalized receiver signal
  • Real time co-simulation of measured signals and measured or modeled network characteristics
  • Evaluate performance margins in equalized systems
  • De-embedding of fixture and probe responses
  • High accuracy far-end channel measurements
  • Emulates any combination of DFE and FFE equalizers
  • Automatic equalizer coefficient optimization
  • Direct entry of FFE and DFE coefficients
To learn more about Eye Doctor visit the Eye Doctor Page or view the Eye Doctor Overview Video

Improving the Accuracy of Multi-Gigabit Signal Integrity Measurements Eye Doctor White Paper from DesignCon 2007

Advanced Tools for High Speed Serial Data Measurements: Equalizer Emulation and Virtual Probing™
www.iec.org TecPreview (registration required)

WaveScan™ Advanced Search

Locate Problems Triggers Won’t Find. WaveScan is a powerful tool that provides the ability to locate unusual events in a single capture, or scan for an event in many acquisitions over a long period of time using more than 20 different search/scan modes. WaveScan uses measurement-based scanning modes, like frequency, to show statistical distribution of events. It overlays events for a quick and simple visual comparison.

To learn more about WaveScan visit the WaveScan Page

For information on upcoming software solutions visit our LeCroy Beta Program



Serial Data Links
HOME
Press Releases
Serial Data Newsletter
links to serial data standards groups
All White Papers

Eye Doctor
(DesignCon 2007)


Jitter Methods
(DesignCon 2007)


DesignCon 2008 - Measurement Based Models - Whitepaper
Application Notes
WiMedia Beaconing Protocol Test Considerations

Other
Product Recommendations
SDA 18000 Datasheet
SDA 11000 Datasheet
SDA 9000 Datasheet
SDA 6000 Datasheet
SDA 4000 Datasheet
SDA 3010 Datasheet
Arrow WaveExpert 100H -
100 GHz Sampling Serial Data Analyzer
WaveLink Probe Datasheet
OE Converters Datasheet



Copyright © LeCroy Corporation 2009